Crystal structure and powder X-ray diffraction data of the super-paramagnetic compound CuFeInTe3

DOI

10.31349/RevMexFis.67.305

Document Type

Journal Article

Publication Date

1-1-2021

Publication Title

Revista Mexicana de Fisica

Volume

67

Issue

2

First Page

305

Last Page

311

ISSN

0035001X

Keywords

alloys, chalcogenide, Crystal structure, powder X-ray diffraction data, Rietveld, semiconductor

Abstract

The crystal structure of the new CuFeInTe3quaternary compound was studied by the Rietveld method from powder X-ray diffraction data. The CuFeInTe3compound crystallize in the tetragonal CuFeInTe3-type structure with space group P¹4 2c (N±112), and unit cell parameters a = 6.1842(1) ° A, c = 12.4163(2) ° A, V = 474.85(1) °A3. The density of CuFeInTe3is ½x = 5:753 g cm¡3. The reliability factors of the Rietveld refinement results are Rp= 5:5%, Rwp= 6:1%, Rexp= 4:7%, and S = 1:3. The powder XRD data of CuFeInTe3are presented and the figures of merit of indexation are M20= 79:4 and F30= 43:3 (0.0045, 154).

Open Access

OA

Preprint

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